Stain compensation in transistors

ABSTRACT

Transistor structures having channel regions comprising alternating layers of compressively and tensilely strained epitaxial materials are provided. The alternating epitaxial layers can form channel regions in single and multigate transistor structures. In alternate embodiments, one of the two alternating layers is selectively etched away to form nanoribbons or nanowires of the remaining material. The resulting strained nanoribbons or nanowires form the channel regions of transistor structures. Also provided are computing devices comprising transistors comprising channel regions comprised of alternating compressively and tensilely strained epitaxial layers and computing devices comprising transistors comprising channel regions comprised of strained nanoribbons or nanowires.

This is a Continuation of application Ser. No. 13/977,188 filed Jun. 28,2013 which is a U.S. National Phase Application under 35 U.S.C. §371 ofInternational Application No. PCT/US2011/064096 filed Dec. 9, 2011.

FIELD OF THE INVENTION

Embodiments of the invention relate generally to integrated circuitdevices, and more specifically to transistors, multigate transistors,PMOS and NMOS transistors, and nanoribbon and nanowire transistors.

BACKGROUND INFORMATION

The push toward ever-smaller more highly integrated circuit (IC) andother semiconductor devices places enormous demands on the techniquesand materials used to construct the devices. In general, an integratedcircuit chip is also known as a microchip, a silicon chip, or a chip. ICchips are found in a variety of common devices, such as in computers,cars, televisions, game systems, CD players, and cellular phones. Aplurality of IC chips are typically built on a silicon wafer (a thinsilicon disk, having a diameter, for example, of 300 mm) and afterprocessing the wafer is diced apart to create individual chips. A 1 cm²IC chip having feature sizes around of about 90 nm can comprise hundredsof millions of components. Current technologies are pushing featuresizes even smaller than 32 nm. Components of IC chips include, forexample, transistors such as CMOS (complementarymetal-oxide-semiconductor) devices, capacitive structures, resistivestructures, and metal lines that provide electronic connections betweencomponents and external devices. Other semiconductor devices include,for example, various diodes, lasers, photodetectors, and magnetic fieldsensors.

BRIEF DESCRIPTION OF THE FIGURES

FIGS. 1A-B are schematic diagrams illustrating cross-sectional views ofa tri-gate transistor structure.

FIGS. 2A-B are schematic diagrams illustrating cross-sectional views ofa bi-gate transistor structure.

FIGS. 3A-B are schematic diagrams illustrating cross-sectional views ofa transistor structure comprising nanowires or nanoribbons in thechannel region.

FIG. 4 illustrates a cross-sectional view of a single gate transistorstructure.

FIG. 5 is a flow chart describing methods for making the channel regionof a transistor.

FIG. 6 is a flow chart describing additional methods for making thechannel region of a transistor.

FIG. 7 is a computing device built in accordance with an implementationof the invention.

DETAILED DESCRIPTION OF THE INVENTION

As the pitch of the elements of a transistor are made increasinglysmaller, the source and drain region volume shrinks and providinguniaxial transistor channel stress through the source and drain regionsbecomes increasingly difficult. Stress in the channel region of atransistor can improve transistor performance. Therefore, devices thatincorporate stress into the channel region without relying on the sourceand drain regions to supply stress are useful. Embodiments of theinvention provide transistors having channel structures having stressimparted from the substrate. Also provided are channel structurescomprised of interlayered compressive and tensile layers and methods ofmaking such channel structures. Additional embodiments of the inventionprovide transistors having a plurality of strained nanoribbons ornanowires in the channel region. Advantageously, embodiments of theinvention provide transistors having strained channel structures havingsignificant heights while maintaining strain in the channel structure.

FIGS. 1A-B show a trigate transistor structure having a strained channelregion. FIG. 1B represents a view along 1-1 (a perpendicular cut intothe page) of the structure of FIG. 1A. The resulting cross sectionalview is rotated by 45°. In FIGS. 1A-B, a substrate 105 houses a channelregion comprised of oppositely strained epitaxial interlayers 110 and115. The oppositely strained epitaxial interlayers 110 and 115 areeither compressively or tensilely strained with respect to the materialon the substrate 105 surface. For example, layer 110 is tensilelystrained and layer 115 is compressively strained or conversely layer 110is compressively strained and layer 115 is tensilely strained. Theoppositely strained epitaxial interlayers 110 and 115 are createdthrough crystal lattice mismatches relative to the crystal lattice ofthe substrate 105 material or a layer of material on the substrate 105surface (“the substrate”). The material selected for the substrate 105can be, for example, any material comprising elements from group III,IV, and/or V of the periodic table, and combination thereof. Then, afirst layer 110 with a larger (smaller) lattice constant is grown in anepitaxial deposition process on the substrate 105. The first layer 110is grown below its critical layer thickness to ensure that fullcompressive (tensile) strain is preserved in the first layer 110.Subsequently, the second layer 115 with a smaller (larger) latticeconstant with respect to substrate 105 is grown in an epitaxialdeposition process on top of the first layer 100. The second layer 115is grown below its critical layer thickness to ensure full tensile(compressive) strain. In embodiments of the invention, additionalsuccessive layers 110 and 115 having a pattern of alternatingcompressive and tensile strain can be grown to extremely tall heightswith minimal to no strain relaxation. In general, the interlayers can becomprised of pure elements and/or mixtures of elements, such as, forexample, Si and Ge, and III-V semiconductor materials (materialscomprising elements found in columns III and V of the periodic table).In embodiments of the invention, the channel structures can comprisequantum wells in which a thin device layer is adjacent to or sandwichedbetween layers having a larger band gap compared to the channelmaterial. In embodiments of the invention, the substrate 105 iscomprised of Si_(X)Ge_(1-X), layer 110 (or layer 115) is comprised ofSi_(Y)Ge_(1-Y) where Y>X, and layer 115 (or layer 110) is comprised ofSi_(Z)Ge_(1-Z) where Z<X, 1>X≧0, and 1≧Y>0, and 1>Z≧0. In additionalembodiments, the substrate 105 is comprised of InP, layer 110 (or layer115) is comprised of In_(X)Ga_(1-X)As where 1≧X>0.53, and layer 115 (orlayer 110) is comprised of In_(Y)Ga_(1-Y)As where 0.53>Y≧0. In furtherembodiments, the substrate 105 is comprised of GaSb, layer 110 (or layer115) is comprised of AlSb, and layer 115 (or layer 110) is comprised ofInAs. In further additional embodiments, the substrate 105 is comprisedof Ge, layer 110 (or layer 115) is comprised of Si_(X)Ge_(1-X), andlayer 115 (or layer 110) is comprised of In_(Y)Ga_(1-Y)As where 1≧X>0and 1≧Y>0. In further additional embodiments, the substrate 105 is GaAs,layer 110 (or layer 115) is GaAs_(X)P_(1-X) where X is a number between1 and 0, and layer 115 (or layer 110) is In_(Y)Ga_(1-Y)P where 1≧Y>0.51.It was found that by using epitaxial interlayered structures comprisingalternating layers of compressively and tensilely strained epitaxialmaterials, it is possible to build channel structures that preservestrain in the layers while having larger heights than conventionalmethods of producing strain in channel regions of transistors. Inembodiments of the invention, channel regions of transistors haveheights, h₁, that range between 10 nm and 100 nm or between 25 nm and 85nm, although other heights are also possible. Although twelve layers ofoppositely strained epitaxial interlayers 110 and 115 are shown in FIG.1, it is also possible to have other numbers of layers 115 and 110, suchas, for example, between and including 3 and 25 layers or between 5 and25 layers, although other numbers are also possible.

In FIG. 1A, source and drain regions 120 and 125 abut ends of thechannel region 110 and 115. In embodiments of the invention, the channelstrain with respect to the substrate is maintained in the channel regionand does not require the use of source/drain materials that createstrain in the channel. The transistor structure additionally comprises agate dielectric 135 and a gate electrode 140. As can be seen from FIG.1B, gate dielectric 135 is disposed on three sides of the channelregion: two sides being transverse to a third side. The gate electrode140 is disposed on the gate dielectric 135. Optionally, insulatingspacers 145 and 146 (FIG. 1A) abut the gate dielectric 135 and the gateelectrode 140. The transistor structure is typically covered in aninsulating dielectric layer, which is partially shown as insulatingregions 150 and 151 (FIG. 1A).

FIGS. 2A-B show a bigate (dual gate) transistor structure having astrained channel region. FIG. 2B represents a view along 2-2 (aperpendicular cut into the page) of the structure of FIG. 2A. Theresulting cross sectional view is rotated by 45°. In FIGS. 2A-B, asubstrate 205 houses a channel region comprised of oppositely strainedepitaxial interlayers 210 and 215. The oppositely strained epitaxialinterlayers 210 and 215 are either compressively or tensilely strainedwith respect to the material on the substrate 205 surface. For example,layer 210 is tensilely strained and layer 215 is compressively strainedor conversely layer 210 is compressively strained and layer 215 istensilely strained. The oppositely strained epitaxial interlayers 210and 215 are created through crystal lattice mismatches relative to thecrystal lattice of the substrate 205 material or a layer of material onthe substrate 105 surface (“the substrate”). The material selected forthe substrate 205 can be, for example, any material comprising elementsfrom group III, IV, and/or V of the periodic table, and combinationthereof. Then, a first layer 210 with a larger (smaller) latticeconstant is grown in an epitaxial deposition process on the substrate205. The first layer 210 is grown below its critical layer thickness toensure that full compressive (tensile) strain is preserved in the firstlayer 210. Subsequently, the second layer 215 with a smaller (larger)lattice constant with respect to substrate 205 is grown in an epitaxialdeposition process on top of the first layer 200. The second layer 215is grown below its critical layer thickness to ensure full tensile(compressive) strain. In embodiments of the invention, additionalsuccessive layers 210 and 215 having a pattern of alternatingcompressive and tensile strain can be grown to extremely tall heightswith minimal to no strain relaxation. In general, the interlayers can becomprised of pure elements and/or mixtures of elements, such as, forexample, Si and Ge, and III-V semiconductor materials (materialscomprising elements found in columns III and V of the periodic table).In embodiments of the invention, the channel structures can comprisequantum wells in which a thin device layer is adjacent to or sandwichedbetween layers having a larger band gap compared to the channelmaterial. In embodiments of the invention, the substrate 205 iscomprised of Si_(X)Ge_(1-X), layer 210 (or layer 215) is comprised ofSi_(Y)Ge_(1-Y) where Y>X, and layer 215 (or layer 210) is comprised ofSi_(Z)Ge_(1-Z) where Z<X, 1>X≧0, 1≧Y>0 and 1>Z≧0. In additionalembodiments, the substrate 205 is comprised of InP, layer 210 (or layer215) is comprised of In_(X)Ga_(1-X)As where 1≧X>0.53, and layer 215 (orlayer 210) is comprised of In_(Y)Ga_(1-Y)As where 0.53>Y≧0. In furtherembodiments, the substrate 205 is comprised of GaSb, layer 210 (or layer215) is comprised of AlSb, and layer 215 (or layer 210) is comprised ofInAs. In further additional embodiments, the substrate 205 is comprisedof Ge, layer 210 (or layer 215) is comprised of Si_(X)Ge_(1-X), andlayer 215 (or layer 210) is comprised of In_(Y)Ga_(1-Y)As where 1≧X>0and 1≧Y>0. In further additional embodiments, the substrate 205 is GaAs,layer 210 (or layer 215) is GaAs_(X)P_(1-X) where 1>X≧0 is a numberbetween 1 and 0, and layer 215 (or layer 210) is In_(Y)Ga_(1-Y)P where1≧Y>0.51. It was found that by using epitaxial interlayered structurescomprising alternating layers of compressively and tensilely strainedepitaxial materials, it is possible to build channel structures thatpreserve strain in the layers while having larger heights thanconventional methods of producing strain in channel regions oftransistors. In embodiments of the invention, channel regions oftransistors have heights, h₁, that range between 10 nm and 100 nm orbetween 25 nm and 85 nm, although other heights are possible. Althoughtwelve layers of oppositely strained epitaxial interlayers 210 and 215are shown in FIG. 2, it is also possible to have other numbers of layers210 and 215, such as, for example, between and including 3 and 25 layersbetween 5 and 25 layers.

In FIG. 2A, source and drain regions 220 and 225 abut ends of thechannel region 210 and 215. In embodiments of the invention, the channelstrain with respect to the substrate is maintained in the channel regionand does not require the use of source/drain stressors. A furtherinsulating region 252 is disposed on a side of channel region 210 and215. In FIG. 2B, the transistor structure additionally comprises a gatedielectric 235 and a gate electrode 240. The gate dielectric 235 isdisposed on two opposing sides of the channel region. The gate electrode240 is disposed on the gate dielectric 235. Optionally, insulatingspacers 245 and 246 (FIG. 2A) abut the gate dielectric 235 and the gateelectrode 240. The transistor structure is typically covered in aninsulating dielectric layer, which is partially shown as insulatingregions 250 and 251 (FIG. 2A).

FIGS. 3A-B show transistor structures having strained nanoribbon ornanowire channel regions. In general, a nanowire can be considered tohave widths and heights that are approximately equal, and nanoribbonscan be considered to have a width that is larger than the height (thelength dimension being the dimension along the length of the wire orribbon). The structures of FIG. 3A-B are similar to the structures ofFIGS. 1-2(A-B), however in embodiments the tensile layers are etchedaway to create PMOS nanowire or nanoribbon channel regions orconversely, the compressive layers are etched away to create NMOSnanowire or nanoribbon channel regions. FIG. 3B represents a view along3-3 (a perpendicular cut into the page) of the structure of FIG. 3A. Theresulting cross sectional view is rotated by 45°. In FIGS. 3A-B, asubstrate 305 houses a channel region comprised nanoribbons or nanowires310. The nanoribbons or nanowires 310 are strained relative to thesubstrate. In embodiments of the invention, the nanowires or nanoribbons310 are compressively strained in PMOS channels and tensilely strainedin NMOS channels. Optionally, epitaxial interlayered regions 315 and 316are located in the transistor structure between the source and drain 320and 325 and the nanoribbon or nanowire 310 region. The optionalepitaxial interlayered regions 315 and 316 are comprised of layersexhibiting alternating compressive and tensile (or vice versa) strainedlayers. In general, the interlayers can be comprised of pure elementsand/or mixtures of elements, such as, for example, Si and Ge, and III-Vsemiconductor materials (materials comprised of elements found incolumns III and V of the periodic table). In embodiments of theinventions, a transistor having compressively strained nanowires ornanoribbons has a substrate 305 surface material comprisingSi_(X)Ge_(1-X), a second epitaxial material comprising Si_(Y)Ge_(1-Y),and a third epitaxial material comprising Si_(Z)Ge_(1-Z) where Y>X, Z<X,1>X≧0, and 1≧Y>0, and 1>Z≧0. In alternate embodiments havingcompressively strained nanowires or nanoribbons, the substrate 305comprises InP, the second epitaxial material comprises In_(X)Ga_(1-X)Aswhere 1≧X>0.53, and the third epitaxial material comprisesIn_(Y)Ga_(1-Y)As where 0.53>Y≧0 or the substrate 305 comprises GaSb, thesecond epitaxial material comprises AlSb, and the third epitaxialmaterial comprises InAs. In further embodiments having compressivelystrained nanowires or nanoribbons, substrate 305 comprises Ge, thesecond epitaxial material comprises Si_(X)Ge_(1-X), where 1>X≧0, and thethird epitaxial material comprises In_(Y)Ga_(1-Y)As where 1≧Y>0, or thesubstrate 305 is comprised of GaAs, the second epitaxial material iscomprised of GaAs_(X)P_(1-X) where 1>X≧0, and the third epitaxialmaterial is comprised of In_(Y)Ga_(1-Y)P where 1≧Y>0.51. In embodimentshaving tensilely strained nanowires or nanoribbons, the substrate 305comprises Si_(x)Ge_(1-X), the second epitaxial material comprisesSi_(Y)Ge_(1-Y), and the third epitaxial material comprisesSi_(Z)Ge_(1-Z) where Y<X, Z>X, 1>X≧0, and 1>Y>0, and 1>Z≧0. In furtherembodiments having tensilely strained nanowires or nanoribbons, thesubstrate 305 comprises Ge, the second epitaxial material comprisesIn_(Y)Ga_(1-Y)As where 1≧Y>0, and the third epitaxial material comprisesSi_(X)Ge_(1-X), where 1≧X>0, or the substrate 305 is comprised of GaAs,the second epitaxial material is comprised of In_(Y)Ga_(1-Y)P where1≧Y>0.51, and the third epitaxial material is comprised GaAs_(X)P_(1-X)where X where 1>X≧0. In subsequent processing events, the secondepitaxial material is etched away (either partially, leaving epitaxialinterlayered regions 315 and 316, or completely leaving no epitaxialinterlayered regions 315 and 316) to create nanowires or nanoribbons 310comprised of the third epitaxial material. In embodiments of theinvention, the nanowires 310 are comprised of, for example, Ge,Si_(X)Ge_(1-X), or a material comprising one or more elements from groupIII, IV, and V of the periodic table. Although four nanoribbons ornanowires 310 are shown in FIGS. 3A-B, other numbers of nanoribbons ornanowires 310 are possible, such as, between and including 1 and 10,between 2 and 10, and between 3 and 10 nanoribbons or nanowires in atransistor, although other numbers are also possible.

In FIG. 3A, source and drain regions 320 and 325 abut the optionalepitaxial interlayered regions 315 and 316 or abut ends of thenanoribbons or nanowires 310 (not shown). In embodiments of theinvention, strain with respect to the substrate is maintained in thechannel region and does not require the use of source/drain stressors.In embodiments, the epitaxial interlayered regions 315 and 316 are notpresent and nanowires or nanoribbons 310 contact the source and drainregions 320 and 325. An insulating layer 330 is disposed between ananoribbon or nanowire 310 and the substrate 305 and is capable ofserving as the bottom gate isolation between the gate and the substrate305. In FIGS. 3A-B, the transistor structure additionally comprises agate dielectric 335 and a gate electrode 340. The gate dielectric 335 isdisposed on the nanoribbons or nanowires 310. The gate electrode 340 isdisposed on the gate dielectric 335. Optionally, insulating spacers 345and 346 abut the gate dielectric 335 and the gate electrode 340. Thetransistor structure is typically covered in an insulating dielectriclayer, which is partially shown as insulating regions 350 and 351.

FIG. 4 illustrates a single gate transistor structure having a strainedchannel region. Other structures are also possible for single gatetransistors, such as, ones having features that are differently orientedrelative to one another and structures having features with differentshapes and/or sizes. For example, single gate transistor structureshaving source and drain regions that are not recessed relative to thechannel region are also possible. In FIG. 4, a substrate layer 405 isboardered by optional isolation trenches 407 and houses a channel regioncomprised of oppositely strained epitaxial interlayers 410 and 415. Theoppositely strained epitaxial interlayers 410 and 415 are eithercompressively or tensilely strained with respect to the substrate. Forexample, layer 410 is tensilely strained and layer 415 is compressivelystrained or conversely layer 410 is compressively strained and layer 415is tensilely strained. The oppositely strained epitaxial interlayers 410and 415 are created through crystal lattice mismatches relative to thesubstrate lattice. The material selected for the substrate 405 can be,for example, any material comprising elements from group III, IV, and/orV of the periodic table, and combination thereof. In general, theepitaxial interlayers 410 and 415 can be comprised of pure elementsand/or mixtures of elements, such as, for example, Si and Ge, and III-Vsemiconductor materials (materials comprising elements found in columnsIII and V of the periodic table). The substrate 405 and the epitaxialinterlayers 410 and 415 can be comprised of the materials described forsubstrates and epitaxial interlayers with respect to FIGS. 1-2(A-B).Optional isolation trenches 407 are comprised of an insulating materialand can electrically isolate the transistor structure from other devicesthat make up the semiconductor chip. Source and drain regions 420 and425 are shown recessed relative to the channel region. Gate electroderegion 430 is on one side of the channel region and is separated fromthe channel region by a gate dielectric region 435. Optional insulatingspacers 440 are formed during device manufacture to facilitatemanufacture and serve to electrically isolate the transistor gateregion. Although six layers of oppositely strained epitaxial interlayers410 and 415 are shown in FIG. 4, it is also possible to have othernumbers of layers 415 and 410, such as, for example, between andincluding 3 and 25 layers or between and including 5 and 25 layers,although other numbers are also possible.

FIG. 5 describes methods for making a strained epitaxial layered channelregion for a tri-gate or bi-gate transistor structure. In FIG. 5, asubstrate is provided that has a first epitaxial material on its surfacehaving a first lattice constant. The first epitaxial material can be alayer of epitaxial material. A second epitaxial material having a secondlattice constant that is either larger (a compressive film) or smaller(a tensile film) than that of the first epitaxial material is depositedonto the substrate surface. A third epitaxial material is then depositedonto the second epitaxial material and the third epitaxial material haseither a larger lattice constant (compressive) or smaller latticeconstant (tensile) relative to that of the substrate. If the secondlayer is deposited as a compressive layer, then the third layer will bedeposited as a tensile layer and the second and third films form astrain compensated stack. Conversely, if the second layer is depositedas a tensile layer, then the third layer is deposited as a compressivelayer. The epitaxial materials can be deposited, for example, by ultrahigh vacuum chemical vapor deposition (UHV-CVD), rapid-thermal chemicalvapor deposition (RTCVD), or molecular beam epitaxy (MBE). Alternatinglayers of epitaxial tensilely and compressively strained materials(materials having smaller and larger lattice constants relative to thesubstrate, respectively) are deposited onto the substrate to create astack of layers exhibiting biaxial strain. It is believed that duringthe manufacture of the channel region of a transistor, the tensile andcompressive interlayers (layers that are strained in the oppositedirection and adjacent to each other) are more stable against relaxationbecause dislocations that would form to relax one layer would increasestrain in the other. Because the relaxation requirements of the balancedstack system are opposing, a larger total critical thickness for thechannel region can be created. Generally, a single film stack that doesnot use strain compensation cannot grow without relaxation or defectformation beyond 50 nm tall for lattice mismatches greater than 1.3%. Inembodiments of the invention, a stack of layers can have from 3 to 25layers or from 5 to 25 layers and/or a height of 10 nm and 100 nm orbetween 25 nm and 85 nm. Exemplary materials for epitaxial layers aredescribed with respect to FIGS. 1A-B and 2A-B. The structure comprisingoppositely strained interlayers is patterned into transistor channeldimensions (for example into fins for a finfet structure) converting thesubstrate biaxial strain into substrate uniaxial strain. Gate dielectricmaterial is then deposited on one, two, or three sides of the layeredtransistor channel region (as shown, for example, with respect to FIGS.1A-B, 2A-B, and 4). Gate electrode material is then deposited onto thegate dielectric material.

FIG. 6 describes methods for making the channel region for a transistorcomprising strained nanoribbons or nanowires. In FIG. 6, a substrate isprovided that has a first epitaxial material on its surface having afirst lattice constant. The first epitaxial material can be a layer ofmaterial. A second epitaxial material having a second lattice constantthat is either larger (a compressive film) or smaller (a tensile film)than that of the first epitaxial material is deposited onto thesubstrate surface. A third epitaxial material is then deposited onto thesecond epitaxial material and the third epitaxial material has either alarger lattice constant (compressive) or smaller lattice constant(tensile) relative to that of the substrate. If the second layer isdeposited as a compressive layer, then the third layer will be depositedas a tensile layer and the second and third films form a straincompensated stack. Conversely, if the second layer is deposited as atensile layer, then the third layer is deposited as a compressive layer.The epitaxial materials can be deposited, for example, by UHV-CVD,RTCVD, or MBE. Alternating layers of epitaxial tensilely andcompressively strained materials (materials having smaller and largerlattice constants relative to the substrate, respectively) are depositedonto the substrate creating a stack of layers exhibiting biaxial strain.It is believed that during the manufacture of the channel region of atransistor, the tensile and compressive interlayers (layers that arestrained in the opposite direction and adjacent to each other) are morestable against relaxation because dislocations that would form to relaxone layer would increase strain in the other. Because the relaxationrequirements of the system are balanced during fabrication, a largertotal critical thickness for the strained channel region can be created.Generally, a single film stack that does not use strain compensationcannot grow without relaxation or defect formation beyond 50 nm forlattice mismatches greater than 1.3%. Exemplary materials for epitaxiallayers are described with respect to FIGS. 3A-B.

The structure comprising oppositely strained layers is patterned intotransistor nanowire or nanoribbon channel dimensions (for example, intofins) converting the substrate biaxial strain into substrate uniaxialstrain. A dummy gate can be formed around the patterned channel regionand source/drain regions formed at the ends of the channel region.Optionally, the dummy gate region is bounded by spacers on two sides.The dummy gate material is removed and a selective etch is performed toremove either the compressively strained epitaxial layers or thetensilely strained epitaxial layers creating nanowires or nanoribbons ofthe remaining material. The nanowires or nanoribbons are suspendedbetween the source and the drain regions. In embodiments of theinvention, regions of tensile and compressive interlayers remain at theends of the nanowires or nanoribbons after the selective etch. Theseinterlayer regions are between the ends of the nanowires or nanoribbonsand the source/drain regions. In other embodiments, no regions oftensile and compressive interlayers remain after the selective etch.Gate dielectric material is deposited on four sides of (around) theexposed nanoribbons or nanowires. Gate electrode material is thendeposited onto the gate dielectric material on four sides of the gatedielectric covered nanoribbons or nanowires creating a channel regionsstructure, for example, according to FIGS. 3A-B.

Gate dielectric materials include, for example, insulating materials,such as, silicon dioxide (SiO₂), silicon oxynitride, silicon nitride,and/or high-k dielectric materials. In general, a high-k dielectric is adielectric material having a dielectric constant greater than that ofSiO₂. Exemplary high-k dielectric materials include hafnium dioxide(HfO₂), hafnium silicon oxide, lanthanum oxide, lanthanum aluminumoxide, zirconium dioxide (ZrO₂), zirconium silicon oxide, titaniumdioxide (TiO₂), tantalum pentaoxide (Ta₂O₅), barium strontium titaniumoxide, barium titanium oxide, strontium titanium oxide, yttrium oxide,aluminum oxide, lead scandium tantalum oxide, lead zinc niobate, andother materials known in the semiconductor art. Gate electrode materialsinclude, for example, materials such as Ti, W, Ta, Al, and alloysthereof, and alloys with rare earth elements, such as Er, Dy or noblemetals such as Pt, and nitrides such as TaN, and TiN. Materials forsources and/or drains include, for example, Si, carbon doped Si, andphosphorus doped Si, for NMOS, and boron doped Si_(X)Ge_(1-X), borondoped Ge, boron doped Ge_(X)Sn_(1-X), and p-doped III-V compounds forPMOS applications.

Typical dielectric materials used for dielectric layers, features,and/or interlayer dielectrics (ILD) include silicon dioxide and low-kdielectric materials. Additional dielectric materials that may be usedinclude, carbon doped oxide (CDO), silicon nitride, silicon oxyntiride,silicon carbide, organic polymers such as perfluorocyclobutane orpolytetrafluoroethylene, fluorosilicate glass (FSG), and/organosilicatessuch as silsesquioxane, siloxane, or organosilicate glass. Thedielectric layer may include pores to further reduce the dielectricconstant.

Devices shown herein can comprise additional structures, such asinsulating layers enclosing devices, additional substrate layers, metaltrenches and vias connecting sources and drains to other components ofan IC device, and other additional layers and/or devices. Componentsillustrated as one layer for simplicity, can comprise a plurality oflayers of the same or a different material depending, for example, onthe manufacturing processes employed in constructing the device and thedesired properties of the device.

Implementations of the invention are housed on a substrate, such as asemiconductor wafer. Substrate surfaces on which transistor structuresaccording to embodiments of the invention can be formed include, forexample, H-terminated silicon, silicon dioxide, silicon, silicongermanium, a group III-V (or a group 13-14 in additional periodic tablecolumn numbering schemes) compound semiconductor, a main-group oxide, ametal, and/or a binary or mixed metal oxide. Layers and layerscomprising devices can also be described as the substrate or part of thesubstrate on which embodiments of the invention are fabricated. Thesubstrate base on which semiconductor devices are built is typically asemiconductor wafer that is diced apart to yield individual IC chips.The base substrate on which a chip is built is typically a siliconwafer, although embodiments of the invention are not dependent on thetype of substrate used. The substrate could also be comprised ofgermanium, indium antimonide, lead telluride, indium arsenide, indiumphosphide, gallium arsenide, gallium antimonide, and/or other groupIII-V materials either alone or in combination with silicon or silicondioxide or other insulating materials.

FIG. 7 illustrates a computing device 1000 in accordance with animplementation of the invention. The computing device 1000 houses amotherboard 1002. The motherboard 1002 may include a number ofcomponents, including but not limited to, a processor 1004 and at leastone communication chip 1006. The processor 1004 is physically andelectrically coupled to the motherboard 1002. In some implementationsthe at least one communication chip 1006 is also physically andelectrically coupled to the motherboard 1002.

Depending on its applications, computing device 1000 may include othercomponents that may or may not be physically and electrically coupled tothe motherboard 1002. These other components include, but are notlimited to, volatile memory (e.g., DRAM), non-volatile memory (e.g.,ROM), a graphics processor, a digital signal processor, a cryptoprocessor, a chipset, an antenna, a display, a touchscreen display, atouchscreen controller, a battery, an audio codec, a video codec, apower amplifier, a global positioning system (GPS) device, a compass, anaccelerometer, a gyroscope, a speaker, a camera, and a mass storagedevice (such as hard disk drive, compact disk (CD), digital versatiledisk (DVD), and so forth).

The communication chip 1006 enables wireless communications for thetransfer of data to and from the computing device 1000. The term“wireless” and its derivatives may be used to describe circuits,devices, systems, methods, techniques, communications channels, etc.,that may communicate data through the use of modulated electromagneticradiation through a non-solid medium. The term does not imply that theassociated devices do not contain any wires, although in someembodiments they might not. The communication chip 1006 may implementany of a number of wireless standards or protocols, including but notlimited to Wi-Fi (IEEE 802.11 family), WiMAX (IEEE 802.16 family), IEEE802.20, long term evolution (LTE), Ev-DO, HSPA+, HSDPA+, HSUPA+, EDGE,GSM, GPRS, CDMA, TDMA, DECT, Bluetooth, derivatives thereof, as well asany other wireless protocols that are designated as 3G, 4G, 5G, andbeyond. The computing device 1000 may include a plurality ofcommunication chips 1006. For instance, a first communication chip 1006may be dedicated to shorter range wireless communications such as Wi-Fiand Bluetooth and a second communication chip 1006 may be dedicated tolonger range wireless communications such as GPS, EDGE, GPRS, CDMA,WiMAX, LTE, Ev-DO, and others.

The processor 1004 of the computing device 1000 includes an integratedcircuit die packaged within the processor 1004. In some implementationsof the invention, the integrated circuit die of the processor includesone or more devices, such as transistors, that are formed in accordancewith implementations of the invention. The term “processor” may refer toany device or portion of a device that processes electronic data fromregisters and/or memory to transform that electronic data into otherelectronic data that may be stored in registers and/or memory.

The communication chip 1006 also includes an integrated circuit diepackaged within the communication chip 1006. In accordance with anotherimplementation of the invention, the integrated circuit die of thecommunication chip includes one or more devices, such as transistors,that are formed in accordance with implementations of the invention.

In further implementations, another component housed within thecomputing device 1000 may contain an integrated circuit die thatincludes one or more devices, such as transistors, that are formed inaccordance with implementations of the invention.

In various implementations, the computing device 1000 may be a laptop, anetbook, a notebook, a smartphone, a tablet, a personal digitalassistant (PDA), an ultra mobile PC, a mobile phone, a desktop computer,a server, a printer, a scanner, a monitor, a set-top box, anentertainment control unit, a digital camera, a portable music player,or a digital video recorder. In further implementations, the computingdevice 1000 may be any other electronic device that processes data.

In the previous description, numerous specific details are set forth,such as layouts for transistors and material regimes, in order toprovide a thorough understanding of embodiments of the presentinvention. It will be apparent to one skilled in the art thatembodiments of the present invention may be practiced without thesespecific details. In other instances, well-known features, such aselectrical connection schemes for transistors and integrated circuitdesign layouts, are not described in detail in order to notunnecessarily obscure embodiments of the present invention. Furthermore,it is to be understood that the various embodiments shown in the Figuresare illustrative representations and are not necessarily drawn to scale.

Persons skilled in the relevant art appreciate that modifications andvariations are possible throughout the disclosure as are substitutionsfor various components shown and described. Reference throughout thisspecification to “one embodiment” or “an embodiment” means that aparticular feature, structure, material, or characteristic described inconnection with the embodiment is included in at least one embodiment ofthe invention, but does not necessarily denote that they are present inevery embodiment. Furthermore, the particular features, structures,materials, and characteristics disclosed in the embodiments may becombined in any suitable manner in one or more embodiments. Variousadditional layers and/or structures may be included and/or describedfeatures may be omitted in other embodiments.

We claim:
 1. A semiconductor device, comprising: a semiconductor findisposed above a substrate, the semiconductor fin comprising a pluralityof alternating compressively strained semiconductor layers and tensilelystrained semiconductor layers; a gate structure disposed on a top andalong sidewalls of the semiconductor fin, the gate structure comprisinga gate electrode disposed on a gate dielectric layer, and the gatestructure defining a channel region comprising the plurality ofalternating compressively strained semiconductor layers and tensilelystrained semiconductor layers of the semiconductor fin; and source anddrain regions disposed on either side of the gate structure, adjacent tothe channel region.
 2. The semiconductor device of claim 1, wherein eachlayer of the plurality of alternating compressively strainedsemiconductor layers and tensilely strained semiconductor layers has athickness below its critical thickness.
 3. The semiconductor device ofclaim 1, wherein the plurality of alternating compressively strainedsemiconductor layers and tensilely strained semiconductor layerscomprises between 5 and 25 layers.
 4. The semiconductor device of claim1, wherein the tensilely strained semiconductor layers of thesemiconductor fin comprise Si_(x)Ge_(1-x), the compressively strainedsemiconductor layers of the semiconductor fin comprise Si_(y)Ge_(1-y),and x>y.
 5. The semiconductor device of claim 1, wherein the tensilelystrained semiconductor layers of the semiconductor fin comprise silicon,and the compressively strained semiconductor layers of the semiconductorfin comprise germanium.
 6. A method of fabricating a semiconductordevice, the method comprising: forming a plurality of alternatingcompressively strained semiconductor layers and tensilely strainedsemiconductor layers above a substrate; forming a semiconductor fin fromthe plurality of alternating compressively strained semiconductor layersand tensilely strained semiconductor layers; forming a gate structure ona top and along sidewalls of the semiconductor fin, the gate structurecomprising a gate electrode disposed on a gate dielectric layer, and thegate structure defining a channel region comprising the plurality ofalternating compressively strained semiconductor layers and tensilelystrained semiconductor layers of the semiconductor fin; and formingsource and drain regions on either side of the gate structure, adjacentto the channel region.
 7. The method of claim 6, wherein forming theplurality of alternating compressively strained semiconductor layers andtensilely strained semiconductor layers comprises forming each layer ofthe plurality of alternating compressively strained semiconductor layersand tensilely strained semiconductor layers to have a thickness belowits critical thickness.
 8. The method of claim 6, wherein forming theplurality of alternating compressively strained semiconductor layers andtensilely strained semiconductor layers comprises forming between 5 and25 layers.
 9. The method of claim 6, wherein forming the plurality ofalternating compressively strained semiconductor layers and tensilelystrained semiconductor layers comprises forming Si_(x)Ge_(1-x) tensilelystrained semiconductor layers and forming Si_(y)Ge_(1-y) compressivelystrained semiconductor layers, where x>y.
 10. The method of claim 6,wherein forming the plurality of alternating compressively strainedsemiconductor layers and tensilely strained semiconductor layerscomprises forming tensilely strained semiconductor layers comprisingsilicon and forming compressively strained semiconductor layerscomprising germanium.
 11. A semiconductor device, comprising: asemiconductor fin disposed above a substrate, the semiconductor fincomprising a plurality of alternating compressively strainedsemiconductor layers and tensilely strained semiconductor layers; aninsulating layer disposed on a top surface of the semiconductor fin; agate structure disposed along sidewalls of the semiconductor fin, thegate structure comprising a gate electrode disposed on a gate dielectriclayer, and the gate structure defining a channel region comprising theplurality of alternating compressively strained semiconductor layers andtensilely strained semiconductor layers of the semiconductor fin; andsource and drain regions disposed on either side of the gate structure,adjacent to the channel region.
 12. The semiconductor device of claim11, wherein each layer of the plurality of alternating compressivelystrained semiconductor layers and tensilely strained semiconductorlayers has a thickness below its critical thickness.
 13. Thesemiconductor device of claim 11, wherein the plurality of alternatingcompressively strained semiconductor layers and tensilely strainedsemiconductor layers comprises between 5 and 25 layers.
 14. Thesemiconductor device of claim 11, wherein the tensilely strainedsemiconductor layers of the semiconductor fin comprise Si_(x)Ge_(1-x),the compressively strained semiconductor layers of the semiconductor fincomprise Si_(y)Ge_(1-y), and x>y.
 15. The semiconductor device of claim11, wherein the tensilely strained semiconductor layers of thesemiconductor fin comprise silicon, and the compressively strainedsemiconductor layers of the semiconductor fin comprise germanium.
 16. Amethod of fabricating a semiconductor device, the method comprising:forming a plurality of alternating compressively strained semiconductorlayers and tensilely strained semiconductor layers above a substrate;forming an insulating material on the plurality of alternatingcompressively strained semiconductor layers and tensilely strainedsemiconductor layers; forming a semiconductor fin from the plurality ofalternating compressively strained semiconductor layers and tensilelystrained semiconductor layers, the semiconductor fin having a topinsulating layer formed from the insulating material; forming a gatestructure along sidewalls of the semiconductor fin, the gate structurecomprising a gate electrode disposed on a gate dielectric layer, and thegate structure defining a channel region comprising the plurality ofalternating compressively strained semiconductor layers and tensilelystrained semiconductor layers of the semiconductor fin; and formingsource and drain regions on either side of the gate structure, adjacentto the channel region.
 17. The method of claim 16, wherein forming theplurality of alternating compressively strained semiconductor layers andtensilely strained semiconductor layers comprises forming each layer ofthe plurality of alternating compressively strained semiconductor layersand tensilely strained semiconductor layers to have a thickness belowits critical thickness.
 18. The method of claim 16, wherein forming theplurality of alternating compressively strained semiconductor layers andtensilely strained semiconductor layers comprises forming between 5 and25 layers.
 19. The method of claim 16, wherein forming the plurality ofalternating compressively strained semiconductor layers and tensilelystrained semiconductor layers comprises forming Si_(x)Ge_(1-x) tensilelystrained semiconductor layers and forming Si_(y)Ge_(1-y) compressivelystrained semiconductor layers, where x>y.
 20. The method of claim 16,wherein forming the plurality of alternating compressively strainedsemiconductor layers and tensilely strained semiconductor layerscomprises forming tensilely strained semiconductor layers comprisingsilicon and forming compressively strained semiconductor layerscomprising germanium.